Van der Pauw Experiment, VDX-01

Van der Pauw Experiment, VDX-01
Van der Pauw Experiment, VDX-01
Price And Quantity
  • Set/Sets
  • 1
  • Set/Sets
  • INR
    Product Specifications
    • Physics Material Science
    • Laboratory use
    • Grey
    Product Description

    Van der Pauw Experiment, VDX-01

    Van der Pauw Set-Up for measurement of resistivity and determination of hall co-effiecients in semiconductor samples.


    Semiconductor material research and device testing often involve determining the resistivity and Hall mobility of a sample. The resistivity of the semiconductor material is often determined using a four-point probe technique. With a fourprobe, or Kelvin, technique, two of the probes are used to source current and the other two probes are used to measure voltage. Using four probes eliminates measurement errors due to the probe resistance, the spreading resistance under each probe, and the contact resistance between each metal probe and the semiconductor material. Because a high impedance voltmeter draws little current, the voltage drops across the probe resistance, spreading resistance, and contact esistance are very small. One common Kelvin technique for determining the resistivity of a semiconductor material is the van der Pauw (VDP) method. The van der Pauw method involves applying a current and measuring voltage using four small contacts on the circumference of a flat, arbitrarily shaped sample of uniform thickness. This method is particularly useful for measuring very small samples because geometric spacing of the contacts is unimportant. Effects due to a sample size, which is the approximate probe spacing, are irrelevant.

    Description of Experimental Set-up

    • Probes Arrangement
    • Van der Pauw Set-up, VDP-01
    • Electromagnet, EMU-50V
    • Constant Current Power Supply, DPS-50
    • Digital Gaussmeter, DGM-202
    Trade Information
    • Telegraphic Transfer (T/T), Delivery Point (DP), Cheque, Cash in Advance (CID), Cash Advance (CA), Cash on Delivery (COD), Cash Against Delivery (CAD)
    • 100 Per Day
    • 1 Week
    • Contact us for information regarding our sample policy
    • Africa, Middle East, Western Europe, Eastern Europe, South America, North America, Central America, Australia, Asia
    • All India
    • ISO 9001:2015 CE
    Related Products
    Linear Variable Differential Transformer, Lvdt-01

    Send Inquiry
    Compensation Design, Cd-02

    Send Inquiry
    Hall Effect in Bismuth (HEX-Bi)

    Send Inquiry
    Dielectric Constant Of Solids And Liquids, Dsl-01

    Send Inquiry
    Thermoluminescence Irradiation Unit TIU-02

    Send Inquiry
    Magnetoresistance Setup (Research Model), MRX-RMN/ MRX-RMC

    Send Inquiry
    right arrow
    left arrow
    Contact Us

    Building 452, Adarsh Nagar, Roorkee, Uttarakhand, 247667, India
    Phone :+918037744515